Title: Statistical distribution of defect parameters
Authors: Kaczer, Ben
Toledano Luque, Maria
Franco, Jacopo
Weckx, Pieter
Issue Date: 2014
Publisher: Springer
Host Document: Bias Temperature Instability for Devices and Circuits pages:161-176
ISBN: 978-1-4614-7903
Publication status: published
KU Leuven publication type: IHb
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.