Title: Evaluation and solutions for P/E window instability induced by electron trapping in high-k inter-gate dielectrics of flash memory cells
Authors: Tang, Baojun
Zhang, Weidong
Degraeve, Robin
Breuil, Laurent
Blomme, Pieter
Zhang, Jianfu
Ji, Zhigang
Zahid, Mohammed
Toledano Luque, Maria
Van den Bosch, Geert
Van Houdt, Jan
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:61 issue:5 pages:1299-1306
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications

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