Title: Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation—application to 6T SRAM
Authors: Weckx, Pieter
Kaczer, Ben
Kukner, Halil
Roussel, Philippe
Raghavan, Praveen
Catthoor, Francky
Groeseneken, Guido
Issue Date: 2014
Host Document: International Reliability Physics Symposium - IRPS pages:5D2
Conference: International Reliability Physics Symposium - IRPS location:Waikoloa, HI USA date:2014-06-01
Article number: 5D2
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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