Title: Accurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion
Authors: Nazir, Aftab
Spessot, Alessio
Eyben, Pierre
Clarysse, Trudo
Ritzenthaler, Romain
Schram, Tom
Vandervorst, Wilfried
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:61 issue:8 pages:2633-2639
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section

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