Title: Experimental validation of self-heating simulations in transistors in deeply scaled nodes
Authors: Bury, Erik
Kaczer, Ben
Roussel, Philippe
Ritzenthaler, Romain
Raleva, Katerina
Vasileska, Dragica
Groeseneken, Guido
Issue Date: 2014
Host Document: International Reliability Physics Symposium - IRPS
Conference: International Reliability Physics Symposium - IRPS location:Waikoloa, HI USA date:2014-06-01
Article number: XT.8
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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