Title: Geometry dependence of total dose effects in bulk FINFETs
Authors: Chatterjee, I
Zhang, E.X
Buva, B. L
Reed, Robert
Alles, M. L
Nahatme, N. N
BAll, D. R
Schrimpf, R
Fleedwood, D. M
Mitard, Jerome
Linten, Dimitri
Simoen, Eddy
Claeys, Cor
Issue Date: 2014
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:61 issue:6 pages:2951-2958
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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