| ITEM METADATA RECORD |
| Title: | Spike anneal peak temperature impact on 1T-DRAM retention time |
| Authors: | Nissimoff, Albert ×
Martino, Joao A
Aoulaiche, Marc
Veloso, Anabela
Witters, Liesbeth
Simoen, Eddy
Claeys, Cor # |
| Issue Date: | 2014 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| Series Title: | IEEE Electron Device Letters vol:35 issue:6 pages:639-641 |
| ISSN: | 0741-3106 |
| Publication status: | published |
| KU Leuven publication type: | IT |
| Appears in Collections: | Associated Section of ESAT - INSYS, Integrated Systems
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× corresponding author |
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# (joint) last author |
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