ITEM METADATA RECORD
Title: Spike anneal peak temperature impact on 1T-DRAM retention time
Authors: Nissimoff, Albert ×
Martino, Joao A
Aoulaiche, Marc
Veloso, Anabela
Witters, Liesbeth
Simoen, Eddy
Claeys, Cor #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:35 issue:6 pages:639-641
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology
× corresponding author
# (joint) last author

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