Title: Spike anneal peak temperature impact on 1T-DRAM retention time
Authors: Nissimoff, Albert ×
Martino, Joao A
Aoulaiche, Marc
Veloso, Anabela
Witters, Liesbeth
Simoen, Eddy
Claeys, Cor #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:35 issue:6 pages:639-641
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science