Title: A radiation hardened TDC with < 10 ps resolution and improved recovery time from single events in 40 nm CMOS
Authors: Prinzie, Jeffrey
Steyaert, Michiel
Leroux, Paul
Issue Date: 2014
Conference: Topical Workshop on Electronics for Particle Physics location:Marseille date:22-26 September 2014
Abstract: A radiation hardened Time-to-Digital Converter (TDC) has been designed with < 10 ps single-shot resolution using resistive interpolation. The TDC uses a DLL based control loop to calibrate gate delays to a reference clock. The control loop uses a novel low bandwidth Bang-Bang phase detector in combination with a high bandwidth dead-zone PFD for fast recovery after single-event strikes. The Bang-Bang phase detector has internal self-calibration for total dose radiation hardening. Finally an adapted flip-flop is used in the time capture registers that has no data dependent delay to improve overall resolution.
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering (ESAT) TC, Technology Campus Geel
Technologiecluster ESAT Elektrotechnische Engineering

Files in This Item:

There are no files associated with this item.


All items in Lirias are protected by copyright, with all rights reserved.