Title: Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits?
Authors: Wang, A ×
Van Aert, S
Goos, Peter
Van Dyck, D #
Issue Date: 2012
Publisher: North-Holland Pub. Co.
Series Title: Ultramicroscopy vol:114 pages:20-30
ISSN: 0304-3991
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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