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Title: Impact of strain on the passivation efficiency of Ge dangling bond interface defects in condensation grown SiO2/GexSi1-x/SiO2/(100) Si structures with nm-thin GexSi1-x layers
Authors: Madia, Oreste ×
Nguyen, A. P. D
Thoan, N. H
Afanas'ev, Valeri
Stesmans, Andre
Souriau, L
Slotte, J
Tuomisto, F #
Issue Date: 2014
Publisher: New York
Series Title: Applied Surface Science vol:291 pages:11-15
ISSN: 0169-4332
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
× corresponding author
# (joint) last author

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