Title: Origin of the deep reset and low variability of pulse-programmed W/Al2O3/TiN/Cu CBRAM devices
Authors: Bellemonte, A
Degraeve, R
Fantini, A
Kim, W
Houssa, Michel
Jurczak, M
Goux, L
Issue Date: 2014
Publisher: IEEE
Conference: IEEE International Memory Workshop location:Taipei, Taiwan date:May 2014
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Semiconductor Physics Section

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