ITEM METADATA RECORD
Title: The effect of beam hardening on resolution in X-ray microtomography
Authors: Van de Casteele, Elke
Van Dyck, Dirk
Sijbers, Jan
Raman, Erik #
Issue Date: 2004
Publisher: SPIE-INT SOC OPTICAL ENGINEERING
Host Document: MEDICAL IMAGING 2004: IMAGE PROCESSING, PTS 1-3 vol:5370 pages:2089-2096
Conference: Medical Imaging 2004 Conference location:San Diego: CA date:FEB 17-19, 2004
ISBN: 0-8194-5283-1
ISSN: 0277-786X
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Non-KU Leuven Association publications
# (joint) last author

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