Title: A single shot TDC with 4.8 ps resolution in 40 nm CMOS for high energy physics applications
Authors: Prinzie, Jeffrey # ×
Steyaert, Michiel
Leroux, Paul #
Issue Date: Jan-2015
Publisher: IOP Publishing Ltd
Series Title: Journal of Instrumentation vol:10 issue:Published 22 January 2015 pages:1-8
Conference: Topical Workshop on Electronics for Particle Physics location:Aix en Provence, France date:22–26 September 2014
Abstract: A robust TDC with 4.8 ps bin width has been designed for harsh environments and high energy physics applications. The circuit uses resistive interpolation DLL with a novel dual phase detector architecture. This architecture improves startup- and recovery speed from single event strikes without control voltage ripple trade-off and requires no off-line calibrations. A 0.43 LSB DNL has been measured at a power consumption of 4.2 mW with an extended frequency range from 0.8 GHz to 2.4 GHz. The TDC has been processed in 40 nm CMOS technology.
ISSN: 1748-0221
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering (ESAT) TC, Technology Campus Geel
Technologiecluster ESAT Elektrotechnische Engineering
× corresponding author
# (joint) last author

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