Title: Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
Authors: Kukner, Halil
Khatib, M
Morrison, S
Weckx, Pieter
Catthoor, Francky
Van der Perre, Liesbet
Lauwereins, Rudy
Groeseneken, Guido
Issue Date: Mar-2014
Host Document: International Symposium on Quality Electronic Design issue:15 pages:473-479
Conference: 15th International Symposium on Quality Electronic Design edition:2014 location:Santa Clara CA, US date:3-5 March 2014
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors

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