|ITEM METADATA RECORD
|Title: ||BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?|
|Authors: ||Kukner, Halil|
Van der Perre, Liesbet
|Issue Date: ||2014 |
|Conference: ||Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale location:Dresden, Germany date:28 March 2014|
|Publication status: ||submitted|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT- TELEMIC, Telecommunications and Microwaves|
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
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