Title: BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Authors: Kukner, Halil
Weckx, Pieter
Raghavan, Praveen
Kaczer, B
Jang, D
Catthoor, Francky
Van der Perre, Liesbet
Lauwereins, Rudy
Groeseneken, Guido
Issue Date: 2014
Conference: Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale location:Dresden, Germany date:28 March 2014
Publication status: submitted
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous

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