Title: Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories
Authors: Hartmann, Matthias
Kukner, Halil
Agrawal, Prashant
Raghavan, Praveen
Van der Perre, Liesbet
Dehaene, Wim
Issue Date: 2014
Host Document: Great Lakes Symposium on VLSI vol:24 pages:243-244
Conference: GLSVLSI edition:24 location:Houston, USA date:21-23 May 2014
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors

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