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Title: Scaling of BTI reliability in presence of Time-zero Variability Pathfinding from planar FET to advanced 3-D FinFET nodes
Authors: Kukner, Halil
Weckx, Pieter
Franco, Jacopo
Toledano-Luque, Maria
Cho, Moonju
Kaczer, Ben
Raghavan, Praveen
Jang, Doyoung
Miyaguchi, Kenichi
Bardon, Marie Garcia
Catthoor, Francky
Van der Perre, Liesbet
Issue Date: 2014
Publisher: IEEE
Host Document: 2014 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM pages:CA.5.1.1-CA.5.1.7
Conference: International Reliability Physics Symposium (IRPS) location:Waikoloa: HI date:JUN 01-05, 2014
ISSN: 1541-7026
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors

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