Title: Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates
Authors: Kukner, Halil ×
Khan, Seyab
Weckx, Pieter
Raghavan, Praveen
Hamdioui, Said
Kaczer, Ben
Catthoor, Francky
Van der Perre, Liesbet
Lauwereins, Rudy
Groeseneken, Guido #
Issue Date: 2014
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:14 issue:1 pages:182-193
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:
File Description Status SizeFormat
Trans_Device_BTImodels_2014.pdf Published 1039KbAdobe PDFView/Open Request a copy

These files are only available to some KU Leuven Association staff members


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science