ITEM METADATA RECORD
Title: X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles
Authors: Perfetti, Giacomo ×
Van de Casteele, Elke
Rieger, Bernd
Wildeboer, Willem J
Meesters, Gabrie M. H #
Issue Date: 2010
Publisher: ELSEVIER SCIENCE BV
Series Title: ADVANCED POWDER TECHNOLOGY vol:21 issue:6 pages:663-675
Conference: 4th Asian Particle Technology Symposium (APT 2009) location:New Delhi: INDIA date:SEP 14-16, 2009
ISSN: 0921-8831
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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