Title: A model-based correction method for beam hardening artefacts in X-ray microtomography
Authors: Van de Casteele, Elke ×
Van Dyck, Dirk
Sijbers, Jan
Raman, Erik #
Issue Date: 2004
Publisher: IOS PRESS
Series Title: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY vol:12 issue:1 pages:43-57
ISSN: 0895-3996
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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