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Title: Prediction of transient hardening after strain path change by a multi-scale crystal plasticity model with anisotropic grain substructure
Authors: Eyckens, Philip ×
Van Bael, Albert
Moerman, Jaap
Vegter, Henk
Van Houtte, Paul #
Issue Date: 15-Oct-2014
Publisher: Elsevier
Series Title: Procedia Engineering vol:81 pages:1318-1323
Conference: International Conference on Technology of Plasticity (ICTP) edition:11 location:Nagoya date:19-24 October 2014
Abstract: Multi-scale modelling offers physical insights in the relationship between microstructure and properties of a material. The macroscopic anisotropic plastic flow may be accounted for by consideration of (a) the polycrystalline nature and (b) the anisotropic grain substructure. The latter contribution to anisotropy manifests itself most clearly in the event of a change in the strain path, as occurs frequently in multi-step forming processes. Under monotonic loading, both the crystallographic texture and the loading-dependent strength contribution from substructure influence the macroscopically observed strength. The presented multi-scale plasticity model for BCC polycrystals combines a crystal plasticity model featuring grain interaction with a substructure model for anisotropic hardening of the individual slip systems. Special attention is given to how plastic deformation is accommodated: either by slip of edge dislocation segments, or alternatively by dislocation loop expansion. Results of this multi-scale modelling approach are shown for a batch-annealed IF steel. Whereas both model variants are seen to capture the transient hardening after different types of strain path changes, the dislocation loop model offers more realistic predictions under a variety of monotonic loading conditions.
ISSN: 1877-7058
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Structural Composites and Alloys, Integrity and Nondestructive Testing
Materials Technology TC, Technology Campus Diepenbeek
Technologiecluster Materialentechnologie
× corresponding author
# (joint) last author

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