Title: GaN HEMT Model Extraction Based on Dynamic-bias Measurements
Authors: Vadalá, Valeria ×
Avolio, Gustavo
Raffo, Antonio
Schreurs, Dominique
Vannini, Giorgio #
Issue Date: Oct-2014
Host Document: European Microwave Integrated Circuits Conference (EuMIC) pages:206-209
Conference: European Microwave Integrated Circuits Conference (EuMIC) edition:9 location:Rome date:5-10 October 2014
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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