Title: Physical Origin of Current Collapse in Au-free AlGaN/GaN Schottky Barrier Diodes
Authors: Hu, Jie ×
Stoffels, Steve
Lenci, Silvia
Ronchi, Nicolo
Venegas, Rafael
You, Shuzhen
Bakeroot, Benoit
Groeseneken, Guido
Decoutere, Stefaan #
Issue Date: 20-Aug-2014
Series Title: Microelectronics Reliability
Article number: 10.1016/j.microrel.2014.07.031
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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