Title: Extending statistical models for batch-end quality prediction to batch control
Authors: Gins, Geert ×
Vanlaer, Jef
Van den Kerkhof, Pieter
Van Impe, Jan #
Issue Date: Jul-2013
Publisher: Springer
Host Document: Lecture Notes in Computer Science vol:7987 pages:40-54
Conference: Industrial Conference on Data Mining (ICDM 2013) edition:13 location:New York, USA date:16-21 July 2013
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Bio- & Chemical Systems Technology, Reactor Engineering and Safety Section
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.