Proceedings of the 2014 International Symposium on Electromagnetic Compatibility pages:79-84
EMC Europe 2014 location:Gothenburg - Sweden date:1-4 September 2014
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of electronic systems
which allows to measure both magnitude and phase of the
electromagnetic near-fields simultaneously. The main goal of the
sequential sampling algorithm is to drastically reduce the total
measurement time to obtain a complete model of the electronic
system’s near-field distribution. Measuring both magnitude and
phase is important for predicting the far-field emission from
the near-field or for building equivalent radiation models of the
device under test. Previous work described such a sequential
sampling algorithm for amplitude-only measurements. The extension
towards both amplitude and phase poses two challenges.
First, the underlying sampling and modelling techniques have to
be adapted such that they can handle building up two separate
models at the same time using a common set of optimal sampling
points and without significant increase of the measurement time.
Second, a good choice has to be made with respect to which
components will be sampled and modelled. It is shown that the
most advantageous choice is to sample and model the real and
imaginary components of the near-fields instead of the amplitude
and phase directly.