Title: Fault Injection Modeling Attacks on 65nm Arbiter and RO Sum PUFs via Environmental Changes
Authors: Delvaux, Jeroen # ×
Verbauwhede, Ingrid #
Issue Date: 2014
Publisher: IEEE
Series Title: IEEE Transactions on Circuits and Systems I: Regular Papers vol:61 issue:6 pages:1701 - 1713
ISSN: 1549-8328
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - COSIC, Computer Security and Industrial Cryptography (+)
× corresponding author
# (joint) last author

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