Title: Trapping in GaN-based metal-insulator-semiconductor transistors: Role of high drain bias and hot electrons
Authors: Meneghini, Matteo ×
Bisi, Davide
Marcon, Denis
Stoffels, Steve
Van Hove, Marleen
Wu, Tian-Li
Decoutere, Stefaan
Meneghesso, Gaudenzio
Zanoni, Enrico #
Issue Date: 4-Apr-2014
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:104 pages:1-4
Article number: 143505
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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