Title: Optimization of Analog Fault Coverage by Exploiting Defect-Specific Masking
Authors: Coyette, Anthony ×
Gielen, Georges
Dobbelaere, Wim
Vanhooren, Ronny #
Issue Date: Jun-2014
Publisher: IEEE
Host Document: 2014 19th IEEE European Test Symposium (ETS) pages:1-6
Conference: European Test Symposium edition:19 location:Paderborn (Germany) date:26-30 May 2014
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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