Title: Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation
Authors: Farsi, Saeed ×
Draxler, Paul
Gheidi, Hamed
Nauwelaers, Bart
Asbeck, Peter
Schreurs, Dominique #
Issue Date: Mar-2014
Publisher: Professional Technical Group on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Microwave Theory and Techniques vol:62 issue:3 pages:645-657
Article number: 10.1109/TMTT.2014.2302745
ISSN: 0018-9480
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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