Title: Negative Bias Temperature Instability in p-FinFETs With 45 degrees Substrate Rotation
Authors: Cho, Moon Ju ×
Ritzenthaler, Romain
Krom, Raymond
Higuchi, Yuichi
Kaczer, Ben
Chiarella, Thomas
Boccardi, Guillaume
Togo, Mitsuhiro
Horiguchi, Naoto
Kauerauf, Thomas
Groeseneken, Guido #
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:34 issue:10 pages:1211-1213
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science