Title: Read and pass disturbance in the programmed states of floating gate Flash memory cells with high-|-$j inter-poly gate dielectric stacks
Authors: Tang, Baojun ×
Robinson, Colin
Zhang, Weidong
Zhang, Fujian
Degraeve, Robin
Blomme, Pieter
Toledano Luque, Maria
Van den Bosch, Geert
Govoreanu, Bogdan
Van Houdt, Jan #
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:7 pages:2261-2267
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications
× corresponding author
# (joint) last author

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