Title: Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
Authors: Kukner, Halil
Weckx, Pieter
Raghavan, Praveen
Kaczer, Ben
Catthoor, Francky
Van der Perre, Liesbet
Lauwereins, Rudy
Groeseneken, Guido
Issue Date: 2013
Publisher: IPC Science and Technology Press
Series Title: Microprocessors and Microsystems vol:37 issue:8_A pages:792-800
ISSN: 0141-9331
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT- TELEMIC, Telecommunications and Microwaves
ESAT - MICAS, Microelectronics and Sensors

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