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Title: Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy
Authors: Schulze, Andreas
Hantschel, Thomas
Eyben, Pierre
Verhulst, Anne
Rooyackers, Rita
Vandooren, Anne
Vandervorst, Wilfried
Issue Date: 2013
Publisher: North-Holland Pub. Co.
Series Title: Ultramicroscopy vol:125 issue:1 pages:18-23
ISSN: 0304-3991
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section

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