|ITEM METADATA RECORD
|Title: ||Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy|
|Authors: ||Schulze, Andreas|
|Issue Date: ||2013 |
|Publisher: ||North-Holland Pub. Co.|
|Series Title: ||Ultramicroscopy vol:125 issue:1 pages:18-23|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Nuclear and Radiation Physics Section|
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