Title: Radiation effects in advanced multiple-gate and silicon-on-insulator transistors
Authors: Simoen, Eddy
Gaillardin, Marc
Paillet, Philippe
Reed, Robert
Schrimpf, Ron
Alles, Michael
El-Mamouni, Farah
Fleetwood, Daniel
Griffoni, Alessio
Claeys, Cor
Issue Date: 2013
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:60 issue:3 pages:1970-1991
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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