Title: Modeling the impact of reset depth on vacancy-induced filament perturbations in HfO2 RRAM
Authors: Raghavan, Naga
Degraeve, Robin
Fantini, Andrea
Goux, Ludovic
Wouters, Dirk
Groeseneken, Guido
Jurczak, Malgorzata
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:34 issue:5 pages:614-616
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous

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