|ITEM METADATA RECORD
|Title: ||Part I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs|
|Authors: ||Walke, Amey|
Rao, V. Ramgopal
|Issue Date: ||2013 |
|Publisher: ||Institute of Electrical and Electronics Engineers|
|Series Title: ||IEEE Transactions on Electron Devices vol:60 issue:12 pages:4057-4064|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science