Title: Part I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs
Authors: Walke, Amey
Verhulst, Anne
Vandooren, Anne
Verreck, Devin
Simoen, Eddy
Rao, V. Ramgopal
Groeseneken, Guido
Collaert, Nadine
Thean, Aaron
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:12 pages:4057-4064
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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