Title: Counterdoped pocket thickness optimization of tunnel field-effect transistors
Authors: Kao, Frank ×
Verhulst, Anne
Vandenberghe, William
De Meyer, Kristin #
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:1 pages:6-12
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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