Title: Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Authors: Raghavan, Naga
Fantini, Andrea
Degraeve, Robin
Roussel, Philippe
Goux, Ludovic
Wouters, Dirk
Groeseneken, Guido
Jurczak, Malgorzata
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:109 pages:177-181
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous

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