Title: Gate current random telegraph noise and single defect conduction
Authors: Kaczer, Ben
Toledano Luque, Maria
Goes, Wolfgang
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:109 pages:123-125
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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