Title: Quantum mechanical performance predictions of p-n-i-n versus pocketed line tunnel field-effect transistors
Authors: Verreck, Devin
Verhulst, Anne
Kao, Frank
Vandenberghe, William
De Meyer, Kristin
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:7 pages:2128-2134
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems

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