Title: Superior reliability of high mobility (Si)Ge channel pMOSFETs
Authors: Franco, Jacopo
Kaczer, Ben
Toledano Luque, Maria
Roussel, Philippe
Cho, Moon Ju
Kauerauf, Thomas
Mitard, Jerome
Eneman, Geert
Witters, Liesbeth
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:109 pages:250-256
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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