Title: New insights into defect loss, slowdown, and device lifetime enhancement
Authors: Duan, M
Zhang, J. F
Ji, Z
Zhang, W. D
Kaczer, Ben
De Gendt, Stefan
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:1 pages:413-419
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Molecular Design and Synthesis
ESAT - MICAS, Microelectronics and Sensors

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science