Title: ESD in FinFET technologies: past learning and emerging challenges
Authors: Linten, Dimitri
Hellings, Geert
Chen, Shih-Hung
Groeseneken, Guido
Issue Date: 2013
Host Document: IEEE International Reliability Physics Symposium - IRPS pages:2B.5
Conference: IEEE International Reliability Physics Symposium - IRPS location:Monterey, CA USA date:14/04/2013
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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