|ITEM METADATA RECORD
|Title: ||ESD in FinFET technologies: past learning and emerging challenges|
|Authors: ||Linten, Dimitri|
|Issue Date: ||2013 |
|Host Document: ||IEEE International Reliability Physics Symposium - IRPS pages:2B.5|
|Conference: ||IEEE International Reliability Physics Symposium - IRPS location:Monterey, CA USA date:14/04/2013|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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