Title: SiGe channel technology: superior reliability toward ultra-thin EOT devices—Part II: time-dependent variability in nanoscaled devices and other reliability issues
Authors: Franco, Jacopo
Kaczer, Ben
Toledano Luque, Maria
Roussel, Philippe
Kauerauf, Thomas
Mitard, Jerome
Witters, Liesbeth
Grasser, Tibor
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:1 pages:405-412
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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