Title: 1/f noise analysis of replacement metal gate bulk p-type fin field effect transistor
Authors: Lee, Jae Woo
Cho, Moon Ju
Simoen, Eddy
Ritzenthaler, Romain
Togo, Mitsuhiro
Boccardi, Guillaume
Mitard, Jerome
Ragnarsson, Lars-Ake
Chiarella, Thomas
Veloso, Anabela
Horiguchi, Naoto
Thean, Aaron
Groeseneken, Guido
Issue Date: 2013
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:102 issue:7 pages:73503
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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