ITEM METADATA RECORD
Title: A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
Authors: Amat, Esteve
Kauerauf, Thomas
Rodríguez, Rosana
Nafría, Montse
Aymerich, Xavier
Degraeve, Robin
Groeseneken, Guido
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:103 pages:144-149
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Non-KU Leuven Association publications

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