Title: Part II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurements
Authors: Walke, Amey ×
Vandooren, Anne
Kaczer, Ben
Verhulst, Anne
Rooyackers, Rita
Simoen, Eddy
Heyns, Marc
Rao, V Ramgopal
Groeseneken, Guido
Collaert, Nadine
Thean, Aaron #
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:12 pages:4065-4072
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Surface and Interface Engineered Materials
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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