Title: Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure
Authors: Ma, J
Zhang, J.F
Ji, Z
Benbakhti, B
Duan, M
Zhang, W
Zheng, X.F
Mitard, Jerome
Kaczer, Ben
Groeseneken, Guido
Hall, S
Robertson, J
Chalker, P
Issue Date: 2013
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:109 pages:43-45
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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