Title: Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems
Authors: Scholz, Mirko
Chen, Shih-Hung
Vandersteen, Gerd
Linten, Dimitri
Hellings, Geert
Sawada, Masanori
Groeseneken, Guido
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:13 issue:1 pages:213-222
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science