Title: New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
Authors: Duan, Meng
Zhang, Jian F
Li, Zhigang
Zhang, Wei Dong
Kaczer, Ben
Schram, Tom
Ritzenthaler, Romain
Groeseneken, Guido
Asenov, Asen
Issue Date: 2013
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electron Devices vol:60 issue:8 pages:2505-2511
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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